New PDF release: Atomic Force Microscopy, Scanning Nearfield Optical

By Gerd Kaupp

ISBN-10: 3540284052

ISBN-13: 9783540284055

ISBN-10: 3642066631

ISBN-13: 9783642066634

Making a transparent contrast is made among nano- and micro-mechanical trying out for actual purposes, this monograph describes the fundamentals and functions of the supermicroscopies AFM and SNOM, and of the nanomechanical trying out on tough and technical typical surfaces within the submicron diversity all the way down to a lateral answer of some nm. New or more desirable instrumentation, new actual legislation and unexpected new purposes in all branches of common sciences (around physics, chemistry, mineralogy, fabrics technology, biology and drugs) and nanotechnology are lined in addition to the assets for pitfalls and blunders. It outlines the dealing with of ordinary and technical samples in terms of these of flat normal samples and emphasizes new targeted gains. Pitfalls and assets of blunders are basically established in addition to their effective treatment while going from molecularly flat to tough surfaces. the educational or commercial scientist learns find out how to practice the foundations for tackling their medical or production projects that come with roughness far-off from usual samples.

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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology) by Gerd Kaupp


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